Yoni Xiong
- Program Year: 4
- Academic Institution: Vanderbilt University
- Field of Study: Radiation Effects and Reliability
- Academic Advisor: Bharat Bhuva
- Practicum(s):
Sandia National Laboratories, New Mexico (2023) - Degree(s):
B.E. Electrical Engineering, Vanderbilt University, 2021
Publications
Journal Papers:Y. Xiong, N. J. Pieper, J. B Kronenberg, Y. Chiang, R. Fung, S.-J. Wen, B. L Bhuva "Evaluation of Threshold Frequencies for Logic Single-Event Upsets at Bulk FinFET Technology Nodes," in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2024.3365474.
N. J. Pieper, Y. Xiong, J. Pasternak, D. R. Ball and B. L. Bhuva, "Effects of TID on SRAM Data Retention Stability at the 5-nm Node," in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2023.3346178
Y. Xiong, N. J. Pieper, N. A. Dodds, G. Vizkelethy, R. N. Nowlin and B. L. Bhuva, Response of 5-nm Bulk FinFET SRAMs to Extreme Ionizing and Non-ionizing Doses, in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2023.3334997.
Y. Xiong et al., Single-Event Upset Cross-Section at High Frequencies for RHBD Flip Flop Designs at the 5-nm Bulk FinFET Node, in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2023.3339329.
N. J. Pieper et al., Temperature Dependence of Critical Charge and Collected Charge in 5-nm FinFET SRAM, in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2023.3336233.
Y. Qian, N. J. Pieper, Y. Xiong, J. Pasternak, D. R. Ball and B. L. Bhuva, SRAM Electrical Variability and SEE Sensitivity at 5-nm Bulk FinFET Technology, in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2023.3326797.
Y. Xiong, N. J. Pieper, A. T. Feeley, B. Narasimham, D. R. Ball and B. L. Bhuva, Single-Event Upset Cross-Section Trends for D-FFs at the 5- and 7-nm Bulk FinFET Technology Nodes, in IEEE Transactions on Nuclear Science, vol. 70, no. 4, pp. 381-386, April 2023, doi: 10.1109/TNS.2022.3226210.
Y. Xiong, N. J. Pieper, M. W. McCurdy, D. R. Ball, B. D. Sierwaski and B. L. Bhuva, Evaluation of the Single-Event-Upset Vulnerability for Low-Energy Protons at the 7- and 5-nm Bulk FinFET Nodes, in IEEE Transactions on Nuclear Science, vol. 70, no. 8, pp. 1687-1693, Aug. 2023, doi: 10.1109/TNS.2023.3246085.
Y. Xiong, N. J. Pieper, B. Narasimham, D. R. Ball and B. L. Bhuva, Efficacy of Spatial and Temporal RHBD Techniques at Advanced Bulk FinFET Technology Nodes, in IEEE Transactions on Nuclear Science, vol. 70, no. 8, pp. 1814-1820, Aug. 2023, doi: 10.1109/TNS.2023.3246067.
N. J. Pieper, Y. Xiong, J. Pasternak, N. A. Dodds, D. R. Ball and B. L. Bhuva, Single-Event Upsets for Single-Port and Two-Port SRAM Cells at the 5-nm FinFET Technology, in IEEE Transactions on Nuclear Science, vol. 70, no. 8, pp. 1673-1679, Aug. 2023, doi: 10.1109/TNS.2023.3240979.
N. J. Pieper et al., Study of Multicell Upsets in SRAM at a 5-nm Bulk FinFET Node, in IEEE Transactions on Nuclear Science, vol. 70, no. 4, pp. 401-409, April 2023, doi: 10.1109/TNS.2023.3240318.
Y. Xiong, A. T. Feeley, D. R. Ball and B. L. Bhuva, Modeling Logic Error Single-Event Cross Sections at the 7-nm Bulk FinFET Technology Node, in IEEE Transactions on Nuclear Science, vol. 69, no. 3, pp. 422-428, March 2022, doi: 10.1109/TNS.2021.3138501.
A. Feeley, Y. Xiong, N. Guruswamy and B. L. Bhuva, Effect of Frequency on Total Ionizing Dose Response of Ring Oscillator Circuits at the 7-nm Bulk FinFET Node, in IEEE Transactions on Nuclear Science, vol. 69, no. 3, pp. 327-332, March 2022, doi: 10.1109/TNS.2022.3144911.
Y. Xiong et al., Supply Voltage Dependence of Ring Oscillator Frequencies for Total Ionizing Dose Exposures for 7-nm Bulk FinFET Technology, in IEEE Transactions on Nuclear Science, vol. 68, no. 8, pp. 1579-1584, Aug. 2021.
Conference Proceedings:
Y. Xiong, N. J. Pieper, J. B. Kronenberg, D. R. Ball, M. Casey and B. L. Bhuva, "Multiple Bit Upsets in Register Circuits at the 5-nm Bulk FinFET Node," 2024 IEEE International Reliability Physics Symposium (IRPS), Grapevine, TX, USA, 2024, pp. P46.RE-1-P46.RE-5, doi: 10.1109/IRPS48228.2024.10529454.
N. J. Pieper, M. Chun, Y. Xiong, H. M. Dattilo, J. Kronenberg, S. Baeg, S.-J. Wen, R. Fung, D. Chan, C. Escobar, B. L. Bhuva "Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems," 2024 IEEE International Reliability Physics Symposium (IRPS), Grapevine, TX, USA, 2024, pp. P39.PR-1-P39.PR-7, doi: 10.1109/IRPS48228.2024.10529337.
J. Kronenberg, Y. Xiong, N. Pieper, D. Ball and B. L. Bhuva, "Single-Event Performance of Flip Flop Designs at the 5-nm Bulk FinFET Node at Near-Threshold Supply Voltages," 2024 IEEE International Reliability Physics Symposium (IRPS), Grapevine, TX, USA, 2024, pp. P42.RE-1-P42.RE-5, doi: 10.1109/IRPS48228.2024.10529437.
Y. Xiong, Y. Chiang, N. J. Pieper, D. R. Ball and B. L. Bhuva, Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology, 2023 IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA, 2023, pp. 1-6, doi: 10.1109/IRPS48203.2023.10117896.
N. J. Pieper, Y. Xiong, D. R. Ball, J. Pasternak and B. L. Bhuva, Effects of Collected Charge and Drain Area on SE Response of SRAMs at the 5-nm FinFET Node, 2023 IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA, 2023, pp. 1-6, doi: 10.1109/IRPS48203.2023.10118115.
Y. Xiong et al., Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment, 2022 IEEE International Reliability Physics Symposium (IRPS), 2022, pp. 7C.3-1-7C.3-7.
N. J. Pieper, Y. Xiong, A. Feeley, D. R. Ball and B. L. Bhuva, Single-Event Latchup Vulnerability at the 7-nm FinFET Node, 2022 IEEE International Reliability Physics Symposium (IRPS), 2022, pp. 5C.2-1-5C.2-6.
N. J. Pieper, Y. Xiong, A. Feeley, D. R. Ball and B. L. Bhuva, Single-Event Latchup Vulnerability at the 7-nm FinFET Node, 2022 IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA, 2022, pp. 5C.2-1-5C.2-6, doi: 10.1109/IRPS48227.2022.9764419.
Y. Xiong, A. Feeley, L. W. Massengill, B. L. Bhuva, S.-J. Wen and R. Fung, Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node, 2021 IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA, 2021, pp. P34.1-P34.5, doi: 10.1109/IRPS46558.2021.9405128.
A. Feeley, Y. Xiong, B. L. Bhuva, B. Narasimham, S. -J. Wen and R. Fung, Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology, 2021 IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA, 2021, pp. P33.1- P33.5, doi: 10.1109/IRPS46558.2021.9405124.
Conference Presentations:
Y. Xiong, N. J. Pieper, J. B. Kronenberg, M. Delaney, C. Nunez, D. R. Ball, M. Casey, R. Fung, S. Wen, and B. L. Bhuva, "Evaluation of SEU Cross-Section Trends for Threshold Voltage Options from the 16-nm to the 3-nm Bulk FinFET Nodes," Presented at the 2024 Nuclear and Space Radiation Effects Conference (NSREC), Oral Presentation, Ottawa, Canada, July 2024.
N. J. Pieper, Y. Xiong, J. Kronenberg, C.Nunez Sanchez, M. Delaney, D. Ball, M. Casey, R. Fung, B. L. Bhuva "Multicell Upsets in Flip-Flops at Advanced FinFET Nodes," Presented at the 2024 Nuclear and Space Radiation Effects Conference (NSREC), Poster Presentation, Ottawa, Canada, July 2024.
J. Kronenberg, N. Pieper, Y. Xiong, C. Nunez Sanchez, D. Ball and B. L. Bhuva, "Single-Event Responses of Dual- and Triple-Well Designs at the 5-nm Bulk FinFET Technology Node," Presented at the 2024 Nuclear and Space Radiation Effects Conference (NSREC), Oral Presentation, Ottawa, Canada, July 2024.
M. Chun, G. Bak, N. Pieper, Y. Xiong, S. Jeon, R. Fung, S. Wen, B. Bhuva, S. Baeg, “Dose Measurements and Effects in DRAMs During PCB Inspections Using X Rays,†Presented at the 2024 Nuclear and Space Radiation Effects Conference (NSREC), Oral Presentation, Ottawa, Canada, July 2024.
Y. Xiong, N. J. Pieper, J. B. Kronenberg, D. R. Ball, M. Casey and B. L. Bhuva, "Multiple Bit Upsets in Register Circuits at the 5-nm Bulk FinFET Node," Presented at the 2024 IEEE International Reliability Physics Symposium (IRPS), Poster Presentation, Dallas, TX, March 2024.
N. J. Pieper, M. Chun, Y. Xiong, H. M. Dattilo, J. Kronenberg, S. Baeg, S.-J. Wen, R. Fung, D. Chan, C. Escobar, B. L. Bhuva "Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems," Presented at the 2024 IEEE International Reliability Physics Symposium (IRPS), Poster Presentation, Dallas, TX, March 2024.
J. Kronenberg, Y. Xiong, N. Pieper, D. Ball and B. L. Bhuva, "Single-Event Performance of Flip Flop Designs at the 5-nm Bulk FinFET Node at Near-Threshold Supply Voltages," Presented at the 2024 IEEE International Reliability Physics Symposium (IRPS), Poster Presentation, Dallas, TX, March 2024.
Y. Xiong, N.J. Pieper, Y. Chiang, R. Fung, S.-J. Wen, and B.L. Bhuva, Effects of Scaling on Logic Single-Event Upsets for Advanced Bulk FinFET Technology Nodes Presented at 2023 IEEE Radiation Effects on Components & Systems (RADECS), Oral Presentation, Toulouse, France, Oct. 2023.
N.J. Pieper, Y. Xiong, J. Pasternack, D.R. Ball, Y. Chiang, B.L. Bhuva, Effects of TID on SRAM Stability at the 5-nm Node, Presented at 2023 IEEE Radiation Effects on Components & Systems (RADECS), Oral Presentation, Toulouse, France, Oct. 2023.
Y. Xiong, N.J. Pieper, N. Dodds, G. Vizkelethy, N. Nowlin, B.L. Bhuva, Ion-Induced Stuck Bits in 5-nm bulk FinFET SRAMs at High Fluences, Presented at the 2023 Nuclear and Space Radiation Effects Conference (NSREC), Oral Presentation, Kansas City, MO, July 2023.
Y. Xiong, N.J. Pieper, Y. Qian, S. Wodzro, B. Narasimham, R. Fung, S.J. Wen, B.L. Bhuva, SEU Cross-Sections at High Frequencies for RHBD Flip Flop Designs at the 5-nm Bulk FinFET Node, Presented at the 2023 Nuclear and Space Radiation Effects Conference (NSREC), Oral Presentation, Kansas City, MO, July 2023.
Y. Qian, N.J. Pieper, Y. Xiong, J. Pasternak, D. Ball, B.L. Bhuva, SRAM Electrical Variability and SEE Sensitivity at 5-nm Bulk FinFET Technology, Presented at the 2023 Nuclear and Space Radiation Effects Conference (NSREC), Oral Presentation, Kansas City, MO, July 2023.
N.J Pieper, Y. Xiong, D.R. Ball, R. Fung, S.J. Wen, J. Pasternak, B.L. Bhuva, Temperature Dependence of Single-Event Upsets and Multi-Ce
Awards
IEEE NSREC 2023 Meritorious Paper AwardIEEE IRPS 2023 Best Oral Presentation
IEEE NPSS Paul Phelps Continuing Education Grant 2022
IEEE NSREC 2022 Best Student Paper Award
Russell G. Hamilton Scholar: 2021-2023
DOE NNSA SSGF: 2021-2023
Dean's List Award, Vanderbilt University: 2019-2017
Cornelius Vanderbilt Scholarship: 2021-2017
Vanderbilt Summer Research Program: 2019
Devon Energy Scholarship: 2021-2017
National Merit Scholar: 2017