Annual Program Review Abstracts
Publications
JOURNAL PUBLICATIONS (23)
1. Y. Xiong, N. J. Pieper, J. B. Kronenberg, D. R. Ball, N. A. Dodds and B. L. Bhuva, "Comparative Study of RHBD Techniques at a 3-nm Bulk FinFET Node," in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2025.3552051.
2. Y. Xiong, N. J. Pieper, J. B. Kronenberg, M. Delaney, C. Nunez, D. R. Ball, M. Casey, R. Fung, S. Wen, and B. L. Bhuva, "SEU Cross-Section Trends for Threshold Voltage Options from 16-nm to 3-nm Bulk FinFET Nodes," in IEEE Transactions on Nuclear Science, Early Access, doi: 10.1109/TNS.2024.3513215.
3. J. B. Kronenberg, N. J. Pieper, Y. Xiong, C. N. N. Sanchez, D. R. Ball and B. L. Bhuva, "Single-Event Responses of Dual-and Triple-well Designs at the 5nm Bulk FinFET Node," in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2025.3545001.
4. N. J. Pieper, Y. Xiong, J. B. Kronenberg, J. Pasternak, D. R. Ball and B. L. Bhuva, "SEU Vulnerability of SRAM Designs at a 3nm Bulk FinFET Node," in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2025.3539979.
5. J. B. Kronenberg, N. J. Pieper, Y. Xiong, D. R. Ball, and B. L. Bhuva, "Single-Event Upsets Due to n-Hits and p-Hits at the 3nm Bulk FinFET Node," in IEEE Transactions on Nuclear Science, Early Access, doi: 10.1109/TNS.2025.3528740.
6. N. J. Pieper, Y. Xiong, J. Kronenberg, C. Nunez Sanchez, M. Delaney, D. Ball, M. Casey, R. Fung, and B. L. Bhuva, "Multicell Upsets in Flip-Flops in Advanced FinFET Nodes," in IEEE Transactions on Nuclear Science, Early Access, doi: 10.1109/TNS.2024.3521007.
7. C. N. Nuñez Sanchez, N. J. Pieper, Y. Xiong, J. B. Kronenberg, D. R. Ball, and B. L. Bhuva, "Evaluation of Fin Geometry and Threshold Voltage Variants on Single-Event Effects in 7nm, 5nm, and 3nm Bulk FinFET Technologies," in IEEE Transactions on Nuclear Science, Early Access, doi: 10.1109/TNS.2024.3503495.
8. Y. Xiong, N. J. Pieper, J. B Kronenberg, Y. Chiang, R. Fung, S.-J. Wen, and B. L Bhuva "Evaluation of Threshold Frequencies for Logic Single-Event Upsets at Bulk FinFET Technology Nodes," in IEEE Transactions on Nuclear Science, vol. 71, no. 8, pp. 1675-1681, Aug. 2024, doi: 10.1109/TNS.2024.3365474.
9. N. J. Pieper, Y. Xiong, J. Pasternak, D. R. Ball, and B. L. Bhuva, "Effects of TID on SRAM Data Retention Stability at the 5-nm Node," in IEEE Transactions on Nuclear Science, vol. 71, no. 8, pp. 1864-1871, Aug. 2024, doi: 10.1109/TNS.2023.3346178
10. Y. Xiong, N. J. Pieper, N. A. Dodds, G. Vizkelethy, R. N. Nowlin, and B. L. Bhuva, “Response of 5-nm Bulk FinFET SRAMs to Extreme Ionizing and Non-ionizing Doses,” in IEEE Transactions on Nuclear Science, vol. 71, no. 4, pp. 437-445, April 2024, doi: 10.1109/TNS.2023.3334997.
11. N. J. Pieper, Y. Xiong, J. Pasternak, D. R. Ball, and B. L. Bhuva, "Effects of TID on SRAM Data Retention Stability at the 5-nm Node," in IEEE Transactions on Nuclear Science, vol. 71, no. 8, pp. 1864-1871, Aug. 2024, doi: 10.1109/TNS.2023.3346178.
12. Y. Xiong, N. J. Pieper, Y. Qian, S. E. Wodzro, B. Narasimham, R. Fung, S.-J. Wen, and B. L. Bhuva, “Single-Event Upset Cross-Section at High Frequencies for RHBD Flip Flop Designs at the 5-nm Bulk FinFET Node,” in IEEE Transactions on Nuclear Science, vol. 71, no. 4, pp. 839-844, April 2024, doi: 10.1109/TNS.2023.3339329.
13. N. J. Pieper, Y. Xiong, J. Pasternak, R. Fung, S.-J. Wen, D. R. Ball, and B. L. Bhuva, “Temperature Dependence of Critical Charge and Collected Charge in 5-nm FinFET SRAM,” in IEEE Transactions on Nuclear Science, vol. 71, no. 4, pp. 861-868, April 2024, doi: 10.1109/TNS.2023.3336233.
14. Y. Qian, N. J. Pieper, Y. Xiong, J. Pasternak, D. R. Ball, and B. L. Bhuva, “SRAM Electrical Variability and SEE Sensitivity at 5-nm Bulk FinFET Technology,” in IEEE Transactions on Nuclear Science, vol. 71, no. 4, pp. 663-669, April 2024, doi: 10.1109/TNS.2023.3326797.
15. Y. Xiong, N. J. Pieper, M. W. McCurdy, D. R. Ball, B. D. Sierwaski, and B. L. Bhuva, “Evaluation of the Single-Event-Upset Vulnerability for Low-Energy Protons at the 7- and 5-nm Bulk FinFET Nodes,” in IEEE Transactions on Nuclear Science, vol. 70, no. 8, pp. 1687-1693, Aug. 2023, doi: 10.1109/TNS.2023.3246085.
16. Y. Xiong, N. J. Pieper, B. Narasimham, D. R. Ball, and B. L. Bhuva, “Efficacy of Spatial and Temporal RHBD Techniques at Advanced Bulk FinFET Technology Nodes,” in IEEE Transactions on Nuclear Science, vol. 70, no. 8, pp. 1814-1820, Aug. 2023, doi: 10.1109/TNS.2023.3246067.
17. N. J. Pieper, Y. Xiong, J. Pasternak, N. A. Dodds, D. R. Ball, and B. L. Bhuva, “Single-Event Upsets for Single-Port and Two-Port SRAM Cells at the 5-nm FinFET Technology,” in IEEE Transactions on Nuclear Science, vol. 70, no. 8, pp. 1673-1679, Aug. 2023, doi: 10.1109/TNS.2023.3240979.
18. Y. Xiong, N. J. Pieper, A. T. Feeley, B. Narasimham, D. R. Ball, and B. L. Bhuva, "Single-Event Upset Cross-Section Trends for D-FFs at the 5- and 7-nm Bulk FinFET Technology Nodes," in IEEE Transactions on Nuclear Science, vol. 70, no. 4, pp. 381-386, April 2023, doi: 10.1109/TNS.2022.3226210.
19. N. J. Pieper, Y. Xiong, A. T. Feeley, J. Pasternack, N. A. Dodds, D. R. Ball, and B. L. Bhuva, “Study of Multicell Upsets in SRAM at a 5-nm Bulk FinFET Node,” in IEEE Transactions on Nuclear Science, vol. 70, no. 4, pp. 401-409, April 2023, doi: 10.1109/TNS.2023.3240318.
20. A.T. Feeley, Y. Xiong, N. J. Pieper, D. R. Ball and B. L. Bhuva, “SE Performance of D-FF Designs with Different VT Options at Near-Threshold Supply Voltages in 7-nm Bulk FinFET Technology,” in IEEE Transactions on Nuclear Science, vol. 69, no. 7, pp. 1582-1586, July 2022, doi: 10.1109/TNS.2022.3169959
21. Y. Xiong, A. T. Feeley, D. R. Ball and B. L. Bhuva, “Modeling Logic Error Single-Event Cross Sections at the 7-nm Bulk FinFET Technology Node,” in IEEE Transactions on Nuclear Science, vol. 69, no. 3, pp. 422-428, March 2022, doi: 10.1109/TNS.2021.3138501.
22. A.T. Feeley, Y. Xiong, N. Guruswamy and B. L. Bhuva, “Effect of Frequency on Total Ionizing Dose Response of Ring Oscillator Circuits at the 7-nm Bulk FinFET Node,” in IEEE Transactions on Nuclear Science, vol. 69, no. 3, pp. 327-332, March 2022, doi: 10.1109/TNS.2022.3144911.
23. Y. Xiong, A. T. Feeley, P. F. Wang, X. Li, E. X. Zhang, L. W. Massengill, and B. L. Bhuva, “Supply Voltage Dependence of Ring Oscillator Frequencies for Total Ionizing Dose Exposures for 7-nm Bulk FinFET Technology,” in IEEE Transactions on Nuclear Science, vol. 68, no. 8, pp. 1579-1584, Aug. 2021.
CONFERENCE PROCEEDINGS (10)
1. Y. Xiong, N. J. Pieper, J. B. Kronenberg, D. R. Ball, M. Casey, and B. L. Bhuva, "Multiple Bit Upsets in Register Circuits at the 5-nm Bulk FinFET Node," 2024 IEEE International Reliability Physics Symposium (IRPS), Grapevine, TX, USA, 2024, pp. P46.RE-1-P46.RE-5, doi: 10.1109/IRPS48228.2024.10529454.
2. N. J. Pieper, M. Chun, Y. Xiong, H. M. Dattilo, J. Kronenberg, S. Baeg, S.-J. Wen, R. Fung, D. Chan, C. Escobar, B. L. Bhuva "Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems," 2024 IEEE International Reliability Physics Symposium (IRPS), Grapevine, TX, USA, 2024, pp. P39.PR-1-P39.PR-7, doi: 10.1109/IRPS48228.2024.10529337.
3. J. Kronenberg, Y. Xiong, N. Pieper, D. Ball, and B. L. Bhuva, "Single-Event Performance of Flip Flop Designs at the 5-nm Bulk FinFET Node at Near-Threshold Supply Voltages," 2024 IEEE International Reliability Physics Symposium (IRPS), Grapevine, TX, USA, 2024, pp. P42.RE-1-P42.RE-5, doi: 10.1109/IRPS48228.2024.10529437.
4. Y. Xiong, Y. Chiang, N. J. Pieper, D. R. Ball, and B. L. Bhuva, “Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology,” 2023 IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA, 2023, pp. 7C.2-1-7C.2-6, doi: 10.1109/IRPS48203.2023.10117896.
5. N. J. Pieper, Y. Xiong, D. R. Ball, J. Pasternak, and B. L. Bhuva, “Effects of Collected Charge and Drain Area on SE Response of SRAMs at the 5-nm FinFET Node,” 2023 IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA, 2023, pp. P53.RE-1- P53.RE-6, doi: 10.1109/IRPS48203.2023.10118115.
6. Y. Xiong, A. F. Feeley, N. J. Pieper, D. R. Ball, B. Narasimham, J. Brockman, N. A. Dodds, S. A. Wender, S.-J. Wen, R. Fung, and B. L. Bhuva, “Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment,” 2022 IEEE International Reliability Physics Symposium (IRPS), 2022,
pp. 7C.3-1-7C.3-7.
7. N. J. Pieper, Y. Xiong, A. T. Feeley, D. R. Ball, and B. L. Bhuva, “Single-Event Latchup Vulnerability at the 7-nm FinFET Node,” 2022 IEEE International Reliability Physics Symposium (IRPS), 2022, pp. 5C.2-1-5C.2-6.
8. N. J. Pieper, Y. Xiong, A. T. Feeley, D. G. Walker, R. Fung, S.-J. Wen, D. R. Ball, and B. L. Bhuva, “Micro-Latchup Location and Temperature Characterization in a 7-nm Bulk FinFET Technology,” 2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Vienna, Austria, 2021, pp. 46-52, doi: 10.1109/RADECS53308.2021.9954525.
9. Y. Xiong, A. T. Feeley, L. W. Massengill, B. L. Bhuva, S.-J. Wen, and R. Fung, “Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node,” 2021 IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA, 2021, pp. P34.1-P34.5, doi: 10.1109/IRPS46558.2021.9405128.
10. A. T. Feeley, Y. Xiong, B. L. Bhuva, B. Narasimham, S.-J. Wen, and R. Fung, “Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology,” 2021 IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA, 2021, pp. P33.1- P33.5, doi: 10.1109/IRPS46558.2021.9405124.
Awards
IEEE Nuclear & Space Radiation Effects Conference (NSREC) 2024 Best Student Paper Award (first-author)
Vanderbilt University C. F. Chen Best Paper Award 2024 (co-author)
IEEE Nuclear & Space Radiation Effects Conference (NSREC) 2023 Meritorious Paper Award (first-author)
IEEE International Reliability Physics Symposium (IRPS) 2023 Best Oral Presentation (first-author)
IEEE International Reliability Physics Symposium (IRPS) 2023 Best Poster Presentation (co-author)
SCALE Ambassador Award (2023)
IEEE Nuclear & Space Radiation Effects Conference (NSREC) 2022 Best Student Paper Award (first-author)
IEEE Nuclear & Plasma Sciences Society (NPSS) Paul Phelps Continuing Education Grant (2022)
Department of Energy (DOE) National Nuclear Security Administration (NNSA) Stewardship Science Graduate Fellowship (4-year, fully-funded research fellowship, 2021-2025)
Russell G. Hamilton Scholar (Graduate School tuition award, 2021-2025)
Electrical Engineering Department Award (top graduating student, 2021)
C. F. Chen Best Design Award (best senior design project, 2021)
Summa cum laude (top 5% in Vanderbilt University Electrical Engineering, 2021)
Cornelius Vanderbilt Scholarship (merit-based, full-tuition scholarship, 2017-2021)
Devon Energy Scholarship (merit-based, $20,000, 2017-2021)
National Science Foundation (NSF) National Youth Science Camp New Mexico Delegate (2017)
National Merit Finalist (merit-based, $8,000, 2017)
National Merit Semifinalist (New Mexico, 2017)
American Association of University Women (AAUW) Honor (2013-2017)
Valedictorian (Carlsbad High School, 346 total class size, 2017)